Research

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Our research aims to develop novel ways of computing, circuit design, and reliability for electronic circuits and systems. Our research mainly targets future and emerging technologies.
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Our research aims to develop novel ways of computing, circuit design, and reliability for electronic circuits and systems. Our research mainly targets emerging technologies and new computing paradigms.
  
 
<div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div>
 
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Circuit Design with Switching Nano Arrays </h2>
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Computing with Nano-Crossbar Arrays </h2>
  
 
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As current CMOS-based technology is approaching its anticipated limits, research is shifting to novel forms of nanoscale technologies including molecular-scale self-assembled systems. Unlike conventional CMOS that can be patterned in complex ways with lithography, self-assembled nanoscale systems generally consist of regular structures. Logical functions are achieved with crossbar-type switches. Our model, a network of four- terminal switches, corresponds to this type of switch in a variety of emerging technologies, including nanowire crossbar arrays and magnetic switch-based structures.
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Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures, and fabricated by exploiting self-assembly as opposed to purely using lithography based conventional and relatively costly CMOS fabrication techniques. Currently, nano-crossbar arrays are fabricated such that each crosspoint can be used as a conventional electronic component such as a diode, a FET, or a switch. This is a unique opportunity that allows us to integrate well developed conventional circuit design techniques into nano-crossbar arrays. Motivated by this, we aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer.
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[[Image:Research-nanoarray-1.png|center|none|800px|link=]]
  
 
<h3>
 
<h3>
 
Synthesis</h3>
 
Synthesis</h3>
In his seminal Master's Thesis, [http://en.wikipedia.org/wiki/Claude_Shannon Claude Shannon] made the connection between Boolean algebra and switching circuits. He considered '''two-terminal''' switching networks to implement any Boolean function that is the foundation of CMOS circuit design techniques. In this work, we have considered '''four-terminal''' switching networks to implement any Boolean function that aims to be a foundation of nano array based circuit design techniques.
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We study '''implementation of Boolean functions''' with nano-crossbar arrays where each crosspoint behaves as a diode, a FET, and a four-terminal switch. For these three types, we give array size formulations for a given Boolean function. Additionally, we focus on four-terminal switch based implementations and propose an algorithm that implements Boolean functions with '''optimal array sizes'''.
 
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[[Image:Research-1.png|center|none|800px|link=]]
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<h3>
 
<h3>
Reliability</h3>
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Fault Tolerance</h3>
  
We have devised a novel framework for digital computation with networks of nanoscale switches with high defect rates, based on the mathematical phenomenon of [http://en.wikipedia.org/wiki/Percolation_theory percolation]. With random connectivity, percolation gives rise to a '''sharp non-linearity''' in the probability of global connectivity as a function of the probability of local connectivity. This phenomenon is exploited to compute Boolean functions robustly, in the presence of random defects.
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We examine reconfigurable crossbar arrays by considering randomly occurred '''stuck-open and stuck-closed crosspoint faults'''. In the presence of '''permanent''' faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. In the presence of '''transient''' faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions
 
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[[Image:Research-2.png|center|none|800px|link=]]
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| width="696" |'''Selected Publications'''
 
| width="696" |'''Selected Publications'''
 
|}
 
|}
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| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Logic Synthesis for Switching Lattices]]
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| width="450"|[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays]]
 
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|- valign="top"
 
| '''authors''':
 
| '''authors''':
| [[Mustafa Altun]] and [http://cadbio.com/wiki/index.php/Marc_Riedel Marc Riedel]
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| Onur Tunali and [[Mustafa Altun]]
 
|- valign="top"
 
|- valign="top"
| '''appeared&nbsp;in''':
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| '''accepted&nbsp;in''':
| [http://www.computer.org/portal/web/tc IEEE Transactions on Computers], <br>Vol. 61, Issue 11, pp. 1588&ndash;1600, 2012.
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| [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of<br> Integrated Circuits and Systems], 2016.
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.dac.com Design Automation Conference], Anaheim, CA, 2010.
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| [http://www.nanoarch.org/ IEEE/ACM International Symposium on Nanoscale Architectures<br> (NANOARCH)], Boston, USA, 2015.
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|}
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| align=center width="70" |
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<span class="plainlinks">
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf]]</span>
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<br>
 +
[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Paper]]
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| align="center" width="70" |
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<span class="plainlinks">
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[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx]]
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</span>
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<br> [http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx Slides]
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{|
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|- valign=top
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| width="100" |'''title''':
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| width="450"|[[Media:Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer.pdf | Synthesis and Performance Optimization of a Switching Nano-crossbar Computer]]
 
|- valign="top"
 
|- valign="top"
| '''presented&nbsp;at''':
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| '''authors''':
| [http://fias.uni-frankfurt.de/ International Conference on Computational Modelling of <br> Nanostructured Materials (ICCMNM)-FIAS], Frankfurt, Germany, 2013.
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| Dan Alexandrescu, [[Mustafa Altun]], Lorena Anghel, Anna Bernasconi,<br> Valentina Ciriani, and Mehdi Tahoori
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|- valign=top
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| '''accepted&nbsp;at''':
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| [http://dsd-seaa2016.cs.ucy.ac.cy/index.php Euromicro Conference on Digital System Design (DSD)],<br> Limassol, Cyprus, 2016.
 
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|}
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| align=center width="70" |
 
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<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/ca/Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf]]</span>
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/a/ab/Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer.pdf]]</span>
 
<br>
 
<br>
[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Paper]]
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[[Media:Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer.pdf | Paper]]
 
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| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt]]
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[[File:PPT.jpg|60px|link=]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt Slides]
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<br> Slides
 
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|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Altun_Riedel_Synthesizing_Logic_with_Percolation_in_Nanoscale_Lattices.pdf | Synthesizing Logic with Percolation in Nanoscale Lattices]]
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| width="450"|[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Logic Synthesis for Switching Lattices]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
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|- valign="top"
 
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| '''appeared&nbsp;in''':
 
| '''appeared&nbsp;in''':
| [http://www.igi-global.com/Bookstore/TitleDetails.aspx?TitleId=1117&DetailsType=Description/ International Journal of Nanotechnology and Molecular Computation], <br>Vol. 3, Issue 2, pp. 12&ndash;30, 2011.
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| [http://www.computer.org/portal/web/tc IEEE Transactions on Computers], <br>Vol. 61, Issue 11, pp. 1588&ndash;1600, 2012.
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|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.dac.com Design Automation Conference], San Francisco, CA, 2009.
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| [http://www.dac.com Design Automation Conference (DAC)], Anaheim, USA, 2010.
 
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|}
 
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/3/3b/Altun_Riedel_Synthesizing_Logic_with_Percolation_in_Nanoscale_Lattices.pdf]]</span>
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/ca/Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf]]</span>
 
<br>
 
<br>
[[Media:Altun_Riedel_Synthesizing_Logic_with_Percolation_in_Nanoscale_Lattices.pdf | Paper]]
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[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Paper]]
 
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<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/fe/Altun_Riedel_Neuhauser_Nanoscale_Digital_Computation_Through_Percolation.ppt]]
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[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/f/fe/Altun_Riedel_Neuhauser_Nanoscale_Digital_Computation_Through_Percolation.ppt Slides]
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<br> [http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt Slides]
 
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{|
 
{|
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|- valign="top"
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|Synthesis and Reliability Analysis of Nano Switching Arrays
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| width="558"|Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-3501-kariyer-gelistirme-programi TUBITAK Career Program (3501)]
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| [http://ec.europa.eu/research/mariecurieactions/about-msca/actions/rise/index_en.htm European Union/European Commission H2020 MCSA <br> Research and Innovation Staff Exchange Program (RISE)]
 +
|- valign="top"
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| '''budget''':
 +
| 724.500 EURO
 
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|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 2014-2017
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| 2015-2019
 
|}
 
|}
 
   
 
   
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|
 
{|
 
{|
|- valign="top"
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|- valign=top
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|Logic Circuit Design for Nano Arrays
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| width="558"|Synthesis and Reliability Analysis of Nano Switching Arrays
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://www.tubitak.gov.tr/tr/burslar/lisans/burs-programlari/icerik-2209-a-universite-ogrencileri-yurt-ici-arastirma-projeleri-destek-p TUBITAK Undergraduate Students Research Projects Support Program (2209/A)]
+
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-3501-kariyer-gelistirme-programi TUBITAK Career Program (3501)]
 +
|- valign="top"
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| '''budget''':
 +
| 189.509 TL
 
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|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 01/2014-07/2014
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| 2014-2017
 
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reliability of Electronic Boards </h2>
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reversible Circuit Design </h2>
 
|-
 
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The rapid developments in electronics, especially in the last decade, have initiated the inception of electronics reliability . Conventionally used accelerated reliability tests have lost their significance; time consuming and expensive feature of these tests is against the demands of today's very rapid electronic product cycles. In this study, we propose less costly, yet accurate, reliability prediction techniques using field return data, new accelerated test methodologies, and physics of failure based simulations. We cooperate with one of the Europe’s largest household appliances companies [http://www.arcelik.com.tr/default.aspx?lang=en-US Arçelik A.Ş.].
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Unlike conventional logic gates, reversible logic gates do not have “don’t-care” conditions. It means that an error occurring in any node of a reversible circuit is always seen at the output that gives a unique opportunity for error detecting/correcting. Motivated by this, we implement error tolerant reversible circuit blocks by exploiting parity preserving logic and Hamming codes.  We aim to design, fabricate, and test a fault-aware 8-bit reversible microprocessor for applications requiring high accuracy and reliability including aerospace, military, and medical applications.
  
[[Image:Research-3.png|center|none|800px|link=]]
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[[Image:Research-reversible-1.png|center|none|800px|link=]]
  
 
<h3>
 
<h3>
Field Data Analysis and Prediction</h3>
 
  
We perform field return data analysis of electronic boards having two steps '''filtering''' and '''modeling'''. In the first step of filtering we eliminate improper data, consisting of obvious and hidden errors, from the whole field return data. In the second step of modeling, we use the filtered data to develop our piecewise reliability model. Our reliability analysis is based on a new technique that deals with forward and backward time analysis of the data.
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Synthesis and Optimization</h3>
  
We precisely predict the reliability performance of electronic boards throughout the warranty period by using very '''short-term field return data'''. For electronic boards targeted in this study, warranty period is 3 years, and we use field data of 3 months.
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We propose a fast synthesis algorithm that implements any given reversible Boolean function with quantum gates. Instead of an exhaustive search on every given function, our algorithm creates a library of '''essential functions''' and performs '''sorting'''. As an example, to implement 4 bit circuits we only use 120 essential functions out of all 20922789888000 functions. We also perform optimization for both '''reversible and quantum circuit costs''' by considering adjacent gate pairs.
  
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| width="696" |'''Selected Publications'''
 
| width="696" |'''Selected Publications'''
 
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| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf | Warranty Forecasting of Electronic Boards using Short-term Field Data]]
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| width="450"|[[Media:Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf| Fast Synthesis of Reversible Circuits using a Sorting Algorithm and Optimization]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Vehbi Comert, [[Mustafa Altun]], [http://akademi.itu.edu.tr/nadar/ Mustafa Nadar], and Ertunc Erturk
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| Omercan Susam and [[Mustafa Altun]]
|- valign=top
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| '''presented&nbsp;at''':
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| [http://rams.org/ Reliability and Maintainability Symposium], Palm Harbor, FL, 2015.
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<span class="plainlinks">
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/f/fd/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf]]</span>
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<br>
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[[Media:Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf| Paper]]
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[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx]]
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</span>
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<br> [http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx Slides]
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| width="100" |'''title''':
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| width="450"|[[Media:Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf | Reliability Prediction of Electronic Boards by Analyzing Field Return Data]]
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|- valign="top"
 
|- valign="top"
| '''authors''':
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| '''accepted&nbsp;in''':
| Vehbi Comert, Hadi Yadavari, [[Mustafa Altun]], and Ertunc Erturk
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| [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], 2016.
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.esrel2014.org/ European Safety and Reliability Conference], Wroclaw ,Poland, 2014.
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| [http://www.ieee-icecs2014.org/ IEEE International Conference on Electronics Circuits and Systems<br> (ICECS)], Marseille, France, 2014.
 
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<span class="plainlinks">
 
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d4/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf]]</span>
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[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/cd/Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf]]</span>
 
<br>
 
<br>
[[Media:Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf | Paper]]
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[[Media:Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf | Paper]]
 
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<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx]]
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[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides]
+
<br> [http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx Slides]
 
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|- valign="top"
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|An Accurate Reliability Methodology for Appliance Electronic Cards
+
| width="558"|Implementation of a Fault-Aware 8-Bit Reversible Microprocessor
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1505-universite-sanayi-isbirligi-destek-programi TUBITAK University-Industry Collaboration Grant Program (1505)]
+
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1002-hizli-destek-programi TUBITAK Short Term R&D Funding Program (1002)]
 +
|- valign="top"
 +
| '''budget''':
 +
| 30.000 TL
 
|- valign="top"
 
|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 2013-2015
+
| 2016-2017
 
|}
 
|}
 
   
 
   
Line 273: Line 282:
 
|
 
|
 
{|
 
{|
|- valign="top"
+
|- valign=top
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|Gate Oxide Breakdown Failure Mechanism of CMOS Transistors
+
| width="558"|Quantum Circuit Design and Computation
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://www.tubitak.gov.tr/tr/burslar/lisans/burs-programlari/icerik-2209-b-sanayi-odakli-lisans-bitirme-tezi-destekleme-programi TUBITAK Industry Oriented Senior Project Support Program (2241/A)]
+
| [http://bap.itu.edu.tr/ Istanbul Technical University Research Support Program (ITU-BAP)]
 
|- valign="top"
 
|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 2013-2014
+
| 2014-2015, ''completed''
 
|}
 
|}
 
   
 
   
Line 290: Line 299:
 
|}
 
|}
  
<!--        QUANTUM       -->
+
<!--        STOCHASTIC       -->
 
+
  
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
 
| colspan="2" style="background:#8FBCAF; text-align:center; padding:1px; border-bottom:1px #8FBCAF solid;" |
 
| colspan="2" style="background:#8FBCAF; text-align:center; padding:1px; border-bottom:1px #8FBCAF solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reversible Circuit Design </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Stochastic Circuit Design </h2>
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
 
<h3>
 
<h3>
Synthesis and Optimization</h3>
+
Accurate Arithmetic Implementations</h3>
  
We propose a fast synthesis algorithm that implements any given reversible Boolean function with quantum gates. Instead of an exhaustive search on every given function, our algorithm creates a library of '''essential functions''' and performs '''sorting'''. As an example, to implement 4 bit circuits we only use 120 essential functions out of all 20922789888000 functions.
+
We propose a method to overcome the main drawback in stochastic computing, '''low accuracy''' or related '''long computing times'''. Our method manipulates stochastic bit streams with the aid of feedback mechanisms. We implement error-free arithmetic multiplier and adder circuits by considering performance parameters area, delay, and accuracy.
  
By considering the physical structure of quantum gates, we show that optimum area solutions proposed in the literature are '''not actually optimum'''; they can be improved.
 
  
[[Image:Research-4.png|center|none|800px|link=]]
+
[[Image:Research-stochastic-1.png|center|none|800px|link=]]
 +
 
 +
<!--        YAYIN      -->
 +
{| id="mp-upper" style="width: 100%; margin:4px 0 0 0; background:none; border-spacing: 0px;"
 +
| class="MainPageBG" style="width:50%; border:0px solid #D8BFD8; vertical-align:top; color:#000;" |
 +
{| id="mp-left" style="width:100%; vertical-align:top;"
 +
 
 +
|
 +
{| style="border:1px solid #abd5f5; background:#d0e5f5; padding:0.2em 0.5em; font-weight:bold;"
 +
 
 +
|- valign=top
 +
| width="696" |'''Selected Publications'''
 +
|}
 +
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 +
 
 +
|
 +
{|
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="450"|[[Media:Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf | Accurate Synthesis of Arithmetic Operations with Stochastic Logic]]
 +
|- valign="top"
 +
| '''authors''':
 +
| Ensar Vahapoglu and [[Mustafa Altun]]
 +
|- valign=top
 +
| '''accepted&nbsp;at''':
 +
| [http://www.isvlsi.org/ IEEE Computer Society Annual Symposium on VLSI (ISVLSI)],<br> Pittsburgh, USA, 2016.
 +
|}
 +
 
 +
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d6/Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf]]</span>
 +
<br>
 +
[[Media:Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf | Paper]]
 +
| align="center" width="70" |
 +
<span class="plainlinks">
 +
 
 +
[[File:PPT.jpg|60px|link=]]
 +
</span>
 +
<br> Poster
 +
|}
 +
 
 +
| style="border:1px solid transparent;" |
 +
<!--        PROJE      -->
 +
| class="MainPageBG" style="width:50%; border:0px solid #A9A9A9; vertical-align:top;"|
 +
{| id="mp-right" style="width:100%; vertical-align:top;"
 +
 
 +
|
 +
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#d0e5f5; padding:0.2em 0.5em; font-weight:bold;"
 +
 
 +
|- valign=top
 +
| width="696" |'''Funding Projects'''
 +
|}
 +
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 +
 
 +
|
 +
{|
 +
|- valign="top"
 +
| width="140" |'''title''':
 +
| width="558"|Implementation of a Fault-Aware 8-Bit Reversible Microprocessor
 +
|- valign="top"
 +
| '''agency & program''':
 +
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1002-hizli-destek-programi TUBITAK Short Term R&D Funding Program (1002)]
 +
|- valign="top"
 +
| '''budget''':
 +
| 30.000 TL
 +
|- valign="top"
 +
| '''duration''':
 +
| 2016-2017
 +
|}
 +
|}
 +
|}
 +
|}
 +
|}
 +
|}
 +
 
 +
<!--        RELIABILITY    -->
 +
 
 +
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 +
|-
 +
| colspan="2" style="background:#8FBC9F; text-align:center; padding:1px; border-bottom:1px #8FBC9F solid;" |
 +
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reliability of Electronic Products </h2>
 +
|-
 +
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 +
 
 +
The rapid developments in electronics, especially in the last decade, have elevated the importance of electronics reliability. Conventionally used accelerated reliability tests have lost their significance; time consuming and expensive feature of these tests is against the demands of today's very rapid electronic product cycles. In this study, we propose less costly, yet accurate, reliability prediction techniques using field return data, new accelerated test methodologies, and physics of failure based simulations. We cooperate with one of the Europe’s largest household appliance companies [http://www.arcelik.com.tr/default.aspx?lang=en-US Arçelik A.Ş.].
 +
 
 +
[[Image:Research-3.png|center|none|800px|link=]]
 +
 
 +
<h3>
 +
Reliability Analysis and Prediction with Field Data</h3>
 +
 
 +
We propose an '''accurate reliability prediction''' model for high-volume electronic products throughout their warranty periods by using field return data. Our model is constructed on a Weibull-exponential hazard rate scheme by using the '''proposed change point detection method''' based on backward and forward data analysis. Our prediction model can make a '''36-month''' (full warranty) reliability prediction of an electronic board with using its field data as short as '''3 months'''.
 +
 
 +
<h3>
 +
Degradation Processes in Varistors</h3>
 +
 
 +
We investigate different degradation mechanisms of ZnO varistors. We propose a model showing how the varistor voltage Vv changes by time for different stress levels. For this purpose, accelerated degradation tests are applied for different AC current levels; then voltage values are measured. Different from the common practice in the literature that considers a degradation with only decreasing Vv values, we demonstrate '''either an increasing or a decreasing trend in the Vv parameter'''.
 +
 
 +
<h3>
 +
Calibrated Accelerated Life Testing</h3>
 +
 
 +
Dramatic decrease in failure rates for electronic products makes conventional accelerated life tests ('''ALT''') extremely time consuming and costly. Recently proposed calibrated accelerated life tests ('''CALT''') aim to use fewer samples than those used in ALT.  We thoroughly compare ALT and CALT by considering the effects of failure rate, acceleration factor, and stress level on the required test time.
  
 
<!--        YAYIN      -->
 
<!--        YAYIN      -->
Line 321: Line 429:
 
| width="696" |'''Selected Publications'''
 
| width="696" |'''Selected Publications'''
 
|}
 
|}
 +
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
  
Line 327: Line 436:
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pdf| An Efficient Algorithm to Synthesize Quantum Circuits and Optimization]]
+
| width="450"|[[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf| A Change-Point based Reliability Prediction Model using Field Return Data]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Ömercan Susam and [[Mustafa Altun]]
+
| [[Mustafa Altun]] and Vehbi Comert
 +
|- valign=top
 +
| '''accepted&nbsp;in''':
 +
| [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], 2016.
 +
|- valign=top
 +
| '''presented&nbsp;at''':
 +
| [http://rams.org/ Reliability and Maintainability Symposium (RAMS)],<br> Palm Harbor, USA, 2015.
 +
|}
 +
 
 +
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/1/16/Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf]]</span>
 +
<br>
 +
[[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf | Paper]]
 +
| align="center" width="70" |
 +
<span class="plainlinks">
 +
 
 +
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx]]
 +
</span>
 +
<br> [http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx Slides]
 +
|}
 +
 
 +
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 +
 
 +
|
 +
{|
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="450"|[[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Effects of ZnO Varistor Degradation on the Overvoltage Protection Mechanism of Electronic Boards]]
 +
|- valign="top"
 +
| '''authors''':
 +
| Hadi Yadavari, Burak Sal, [[Mustafa Altun]], Ertunc Erturk, and Baris Ocak
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.ieee-icecs2014.org/ IEEE International Conference on Electronics Circuits and Systems],<br> Marseille, France, 2014.
+
| [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)],<br> Zurich, Switzerland, 2015.
 
|}
 
|}
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/7/71/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d7/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf]]</span>
 
<br>
 
<br>
[[Media:Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pdf | Paper]]
+
[[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx]]
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx Slides]
+
<br> [http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx Slides]
 
|}
 
|}
  
 +
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 +
 +
|
 +
{|
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="450"|[[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Extensive Investigation of Calibrated Accelerated Life Testing (CALT) in Comparison with Classical Accelerated Life Testing (ALT)]]
 +
|- valign="top"
 +
| '''authors''':
 +
| Burak Sal and [[Mustafa Altun]]
 +
|- valign="top"
 +
| '''presented&nbsp;at''':
 +
| [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)],<br> Zurich, Switzerland, 2015.
 
|}
 
|}
 +
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/0/07/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf]]</span>
 +
<br>
 +
[[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Paper]]
 +
| align="center" width="70" |
 +
<span class="plainlinks">
  
 +
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx]]
 +
</span>
 +
<br> [http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx Slides]
 +
|}
 +
|}
 
| style="border:1px solid transparent;" |
 
| style="border:1px solid transparent;" |
 
<!--        PROJE      -->
 
<!--        PROJE      -->
 
| class="MainPageBG" style="width:50%; border:0px solid #A9A9A9; vertical-align:top;"|
 
| class="MainPageBG" style="width:50%; border:0px solid #A9A9A9; vertical-align:top;"|
 
{| id="mp-right" style="width:100%; vertical-align:top;"
 
{| id="mp-right" style="width:100%; vertical-align:top;"
 
 
|
 
|
  
Line 368: Line 532:
 
|- valign=top
 
|- valign=top
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|Quantum Circuit Design and Computation
+
| width="558"|An Accurate Reliability Methodology for Appliance Electronic Cards
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://bap.itu.edu.tr/ Istanbul Technical University Research Support Program (ITU-BAP)]
+
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1505-universite-sanayi-isbirligi-destek-programi TUBITAK University-Industry Collaboration Grant Program (1505)]
 +
|- valign="top"
 +
| '''budget''':
 +
| 211.800 TL
 
|- valign="top"
 
|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 2014-2015
+
| 2013-2015, ''completed''
 
|}
 
|}
 
   
 
   
Line 384: Line 551:
 
|- valign="top"
 
|- valign="top"
 
| width="140" |'''title''':
 
| width="140" |'''title''':
| width="558"|Synthesizing Quantum Circuits
+
| width="558"|Gate Oxide Breakdown Failure Mechanism of CMOS Transistors
 
|- valign="top"
 
|- valign="top"
 
| '''agency & program''':
 
| '''agency & program''':
| [http://tubitak.gov.tr/tr/burslar/lisansustu/egitim-burs-programlari/icerik-2211-yurt-ici-lisansustu-burs-programi TUBITAK MSc Scholarship Program in Priority Areas (2210/C)]
+
| [http://www.tubitak.gov.tr/tr/burslar/lisans/burs-programlari/icerik-2209-b-sanayi-odakli-lisans-bitirme-tezi-destekleme-programi TUBITAK Industry Oriented Senior Project Support Program (2241/A)]
 
|- valign="top"
 
|- valign="top"
 
| '''duration''':
 
| '''duration''':
| 2014-2015
+
| 2013-2014, ''completed''
 
|}
 
|}
 
   
 
   
 
|}
 
|}
 +
 
|}
 
|}
 
|}
 
|}
Line 403: Line 571:
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
| colspan="2" style="background:#8FBC9F; text-align:center; padding:1px; border-bottom:1px #8FBC9F solid;" |
+
| colspan="2" style="background:#8FBC8F; text-align:center; padding:1px; border-bottom:1px #8FBC8F solid;" |
 
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Analog Circuit Design </h2>
 
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Analog Circuit Design </h2>
 
|-
 
|-
Line 466: Line 634:
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
| colspan="2" style="background:#8FBC8F; text-align:center; padding:1px; border-bottom:1px #8FBC8F solid;" |
+
| colspan="2" style="background:#8FBC7F; text-align:center; padding:1px; border-bottom:1px #8FBC7F solid;" |
 
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Discrete Mathematics </h2>
 
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Discrete Mathematics </h2>
 
|-
 
|-
Line 498: Line 666:
 
| [[Mustafa Altun]] and [http://cadbio.com/wiki/index.php/Marc_Riedel Marc Riedel]
 
| [[Mustafa Altun]] and [http://cadbio.com/wiki/index.php/Marc_Riedel Marc Riedel]
 
|- valign="top"
 
|- valign="top"
| '''submitted &nbsp;to''':
+
| '''appeared &nbsp;in''':
| ..., 2014.
+
| [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], <br>Vol. 32, Issue 3, 2016.
 
|}
 
|}
 
| align=center width="70" |
 
| align=center width="70" |

Revision as of 09:21, 14 August 2016

Our research aims to develop novel ways of computing, circuit design, and reliability for electronic circuits and systems. Our research mainly targets emerging technologies and new computing paradigms.

Contents

Computing with Nano-Crossbar Arrays

Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures, and fabricated by exploiting self-assembly as opposed to purely using lithography based conventional and relatively costly CMOS fabrication techniques. Currently, nano-crossbar arrays are fabricated such that each crosspoint can be used as a conventional electronic component such as a diode, a FET, or a switch. This is a unique opportunity that allows us to integrate well developed conventional circuit design techniques into nano-crossbar arrays. Motivated by this, we aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer.


Research-nanoarray-1.png

Synthesis

We study implementation of Boolean functions with nano-crossbar arrays where each crosspoint behaves as a diode, a FET, and a four-terminal switch. For these three types, we give array size formulations for a given Boolean function. Additionally, we focus on four-terminal switch based implementations and propose an algorithm that implements Boolean functions with optimal array sizes.

Fault Tolerance

We examine reconfigurable crossbar arrays by considering randomly occurred stuck-open and stuck-closed crosspoint faults. In the presence of permanent faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. In the presence of transient faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions

Selected Publications
title: Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays
authors: Onur Tunali and Mustafa Altun
accepted in: IEEE Transactions on Computer-Aided Design of
Integrated Circuits and Systems
, 2016.
presented at: IEEE/ACM International Symposium on Nanoscale Architectures
(NANOARCH)
, Boston, USA, 2015.

PDF.png
Paper

PPT.jpg
Slides

title: Synthesis and Performance Optimization of a Switching Nano-crossbar Computer
authors: Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi,
Valentina Ciriani, and Mehdi Tahoori
accepted at: Euromicro Conference on Digital System Design (DSD),
Limassol, Cyprus, 2016.

PDF.png
Paper

PPT.jpg
Slides

title: Logic Synthesis for Switching Lattices
authors: Mustafa Altun and Marc Riedel
appeared in: IEEE Transactions on Computers,
Vol. 61, Issue 11, pp. 1588–1600, 2012.
presented at: Design Automation Conference (DAC), Anaheim, USA, 2010.

PDF.png
Paper

PPT.jpg
Slides

Funding Projects
title: Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
agency & program: European Union/European Commission H2020 MCSA
Research and Innovation Staff Exchange Program (RISE)
budget: 724.500 EURO
duration: 2015-2019
title: Synthesis and Reliability Analysis of Nano Switching Arrays
agency & program: TUBITAK Career Program (3501)
budget: 189.509 TL
duration: 2014-2017


Reversible Circuit Design

Unlike conventional logic gates, reversible logic gates do not have “don’t-care” conditions. It means that an error occurring in any node of a reversible circuit is always seen at the output that gives a unique opportunity for error detecting/correcting. Motivated by this, we implement error tolerant reversible circuit blocks by exploiting parity preserving logic and Hamming codes. We aim to design, fabricate, and test a fault-aware 8-bit reversible microprocessor for applications requiring high accuracy and reliability including aerospace, military, and medical applications.

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Synthesis and Optimization

We propose a fast synthesis algorithm that implements any given reversible Boolean function with quantum gates. Instead of an exhaustive search on every given function, our algorithm creates a library of essential functions and performs sorting. As an example, to implement 4 bit circuits we only use 120 essential functions out of all 20922789888000 functions. We also perform optimization for both reversible and quantum circuit costs by considering adjacent gate pairs.

Selected Publications
title: Fast Synthesis of Reversible Circuits using a Sorting Algorithm and Optimization
authors: Omercan Susam and Mustafa Altun
accepted in: Journal of Multiple-Valued Logic and Soft Computing, 2016.
presented at: IEEE International Conference on Electronics Circuits and Systems
(ICECS)
, Marseille, France, 2014.

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Funding Projects
title: Implementation of a Fault-Aware 8-Bit Reversible Microprocessor
agency & program: TUBITAK Short Term R&D Funding Program (1002)
budget: 30.000 TL
duration: 2016-2017
title: Quantum Circuit Design and Computation
agency & program: Istanbul Technical University Research Support Program (ITU-BAP)
duration: 2014-2015, completed


Stochastic Circuit Design

Accurate Arithmetic Implementations

We propose a method to overcome the main drawback in stochastic computing, low accuracy or related long computing times. Our method manipulates stochastic bit streams with the aid of feedback mechanisms. We implement error-free arithmetic multiplier and adder circuits by considering performance parameters area, delay, and accuracy.


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Selected Publications
title: Accurate Synthesis of Arithmetic Operations with Stochastic Logic
authors: Ensar Vahapoglu and Mustafa Altun
accepted at: IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
Pittsburgh, USA, 2016.

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Funding Projects
title: Implementation of a Fault-Aware 8-Bit Reversible Microprocessor
agency & program: TUBITAK Short Term R&D Funding Program (1002)
budget: 30.000 TL
duration: 2016-2017


Reliability of Electronic Products

The rapid developments in electronics, especially in the last decade, have elevated the importance of electronics reliability. Conventionally used accelerated reliability tests have lost their significance; time consuming and expensive feature of these tests is against the demands of today's very rapid electronic product cycles. In this study, we propose less costly, yet accurate, reliability prediction techniques using field return data, new accelerated test methodologies, and physics of failure based simulations. We cooperate with one of the Europe’s largest household appliance companies Arçelik A.Ş..

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Reliability Analysis and Prediction with Field Data

We propose an accurate reliability prediction model for high-volume electronic products throughout their warranty periods by using field return data. Our model is constructed on a Weibull-exponential hazard rate scheme by using the proposed change point detection method based on backward and forward data analysis. Our prediction model can make a 36-month (full warranty) reliability prediction of an electronic board with using its field data as short as 3 months.

Degradation Processes in Varistors

We investigate different degradation mechanisms of ZnO varistors. We propose a model showing how the varistor voltage Vv changes by time for different stress levels. For this purpose, accelerated degradation tests are applied for different AC current levels; then voltage values are measured. Different from the common practice in the literature that considers a degradation with only decreasing Vv values, we demonstrate either an increasing or a decreasing trend in the Vv parameter.

Calibrated Accelerated Life Testing

Dramatic decrease in failure rates for electronic products makes conventional accelerated life tests (ALT) extremely time consuming and costly. Recently proposed calibrated accelerated life tests (CALT) aim to use fewer samples than those used in ALT. We thoroughly compare ALT and CALT by considering the effects of failure rate, acceleration factor, and stress level on the required test time.

Selected Publications
title: A Change-Point based Reliability Prediction Model using Field Return Data
authors: Mustafa Altun and Vehbi Comert
accepted in: Reliability Engineering and System Safety, 2016.
presented at: Reliability and Maintainability Symposium (RAMS),
Palm Harbor, USA, 2015.

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title: Effects of ZnO Varistor Degradation on the Overvoltage Protection Mechanism of Electronic Boards
authors: Hadi Yadavari, Burak Sal, Mustafa Altun, Ertunc Erturk, and Baris Ocak
presented at: European Safety and Reliability Conference (ESREL),
Zurich, Switzerland, 2015.

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title: Extensive Investigation of Calibrated Accelerated Life Testing (CALT) in Comparison with Classical Accelerated Life Testing (ALT)
authors: Burak Sal and Mustafa Altun
presented at: European Safety and Reliability Conference (ESREL),
Zurich, Switzerland, 2015.

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Funding Projects
title: An Accurate Reliability Methodology for Appliance Electronic Cards
agency & program: TUBITAK University-Industry Collaboration Grant Program (1505)
budget: 211.800 TL
duration: 2013-2015, completed
title: Gate Oxide Breakdown Failure Mechanism of CMOS Transistors
agency & program: TUBITAK Industry Oriented Senior Project Support Program (2241/A)
duration: 2013-2014, completed


Analog Circuit Design

Positive Feedback

The conventional wisdom is that analog circuits should not include positive feedback loops. As controversial as it seems, we have successfully used positive feedback for impedance improvement in a current amplifier. With adding few transistors we have achieved very low input resistance values. Additionally, we have proposed a new fully-differential current amplifier and tested it in a filter application.

Selected Publications
title: Design of a Fully Differential Current Mode Operational Amplifier with its Filter Applications
authors: Mustafa Altun and Hakan Kuntman
appeared in: AEU International Journal of Electronics and Communications,
Vol. 62, Issue 3, pp. 39–44, 2008.
presented at: ACM Great Lakes Symposium on VLSI (GLSVLSI), Stresa, Italy, 2007.

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Discrete Mathematics

Self Duality Problem

The problem of testing whether a monotone Boolean function in irredundant disjuntive normal form (IDNF) is self-dual is one of few problems in circuit/time complexity whose precise tractability status is unknown. We have focused on this famous problem. We have shown that monotone self-dual Boolean functions in IDNF do not have more variables than disjuncts. We have proposed an algorithm to test whether a monotone Boolean function in IDNF with n variables and n disjuncts is self-dual. The algorithm runs in O(n^3) time.

Selected Publications
title: A Study on Monotone Self-dual Boolean Functions
authors: Mustafa Altun and Marc Riedel
appeared  in: Acta Mathematicae Applicatae Sinica - English Series,
Vol. 32, Issue 3, 2016.

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