|
|
Line 433: |
Line 433: |
| | | |
| == Reliability of Electronic Products == | | == Reliability of Electronic Products == |
| + | |
| + | {| style="border:2px solid #abd5f5; background:#f1f5fc; " |
| + | |
| + | | |
| + | {| |
| + | |- valign=top |
| + | | width="100" |'''title''': |
| + | | width="624"|[[Media: Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf| Distinct Degradation Processes in ZnO Varistors: Reliability Analysis and Modeling with Accelerated AC Tests]] |
| + | |- valign="top" |
| + | | '''authors''': |
| + | | Hadi Yadavari and [[Mustafa Altun]] |
| + | |- valign="top" |
| + | | '''accepted in''': |
| + | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], 2016. |
| + | |} |
| + | | align=center width="70" | |
| + | <span class="plainlinks"> |
| + | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/1/16/Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf]]</span> |
| + | <br> |
| + | [[Media:Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf | Paper]] |
| + | |
| + | |} |
| | | |
| {| style="border:2px solid #abd5f5; background:#f1f5fc; " | | {| style="border:2px solid #abd5f5; background:#f1f5fc; " |
All materials are subject to copyrights.