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| | </span> | | </span> |
| | <br> [http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx Poster] | | <br> [http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx Poster] |
| − | |}
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| − |
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| − | == Reliability of Electronic Products ==
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| − |
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| − | {| style="border:2px solid #abd5f5; background:#f1f5fc; "
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
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| − | | width="624"|[[Media: Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf| Distinct Degradation Processes in ZnO Varistors: Reliability Analysis and Modeling with Accelerated AC Tests]]
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| − | |- valign="top"
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| − | | '''authors''':
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| − | | Hadi Yadavari and [[Mustafa Altun]]
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| − | |- valign="top"
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| − | | '''accepted in''':
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| − | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], 2016.
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| − | |}
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| − | | align=center width="70" |
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| − | <span class="plainlinks">
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| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/dd/Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf]]</span>
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| − | <br>
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| − | [[Media:Yadavari_Altun_Distinct_Degradation_Processes_in_ZnO_varistors.pdf | Paper]]
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| − |
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| − | |}
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| − |
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| − | {| style="border:2px solid #abd5f5; background:#f1f5fc; "
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
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| − | | width="624"|[[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf| A Change-Point based Reliability Prediction Model using Field Return Data]]
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| − | |- valign="top"
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| − | | '''authors''':
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| − | | [[Mustafa Altun]] and Vehbi Comert
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| − | |- valign="top"
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| − | | '''appeared in''':
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| − | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Volume 156, pp 175–184, 2016.
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| − | |}
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| − | | align=center width="70" |
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| − | <span class="plainlinks">
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| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/1/16/Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf]]</span>
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| − | <br>
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| − | [[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf | Paper]]
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| − |
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| − | |}
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| − |
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| − | {| style="border:2px solid #abd5f5; background:#f1f5fc;"
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
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| − | | width="550"|[[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Effects of ZnO Varistor Degradation on the Overvoltage Protection Mechanism of Electronic Boards]]
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| − | |- valign="top"
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| − | | '''authors''':
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| − | | Hadi Yadavari, Burak Sal, [[Mustafa Altun]], Ertunc Erturk, and Baris Ocak
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| − | |- valign="top"
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| − | | '''presented at''':
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| − | | [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)], Zurich, Switzerland, 2015.
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| − | |}
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| − | | align=center width="70" |
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| − | <span class="plainlinks">
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| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d7/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf]]</span>
| |
| − | <br>
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| − | [[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Paper]]
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| − | | align="center" width="70" |
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| − | <span class="plainlinks">
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| − |
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| − | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx]]
| |
| − | </span>
| |
| − | <br> [http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx Slides]
| |
| − | |}
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| − |
| |
| − | {| style="border:2px solid #abd5f5; background:#f1f5fc;"
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
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| − | | width="550"|[[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Extensive Investigation of Calibrated Accelerated Life Testing (CALT) in Comparison with Classical Accelerated Life Testing (ALT)]]
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| − | |- valign="top"
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| − | | '''authors''':
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| − | | Burak Sal and [[Mustafa Altun]]
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| − | |- valign="top"
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| − | | '''presented at''':
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| − | | [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)], Zurich, Switzerland, 2015.
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| − | |}
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| − | | align=center width="70" |
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| − | <span class="plainlinks">
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| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/0/07/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf]]</span>
| |
| − | <br>
| |
| − | [[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Paper]]
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| − | | align="center" width="70" |
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| − | <span class="plainlinks">
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| − |
| |
| − | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx]]
| |
| − | </span>
| |
| − | <br> [http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx Slides]
| |
| − | |}
| |
| − |
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| − | {| style="border:2px solid #abd5f5; background:#f1f5fc;"
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
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| − | | width="550"|[[Media:Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf | Warranty Forecasting of Electronic Boards using Short-term Field Data]]
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| − | |- valign="top"
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| − | | '''authors''':
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| − | | Vehbi Comert, [[Mustafa Altun]], [http://akademi.itu.edu.tr/nadar/ Mustafa Nadar], and Ertunc Erturk
| |
| − | |- valign=top
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| − | | '''presented at''':
| |
| − | | [http://rams.org/ Reliability and Maintainability Symposium (RAMS)], Palm Harbor, USA, 2015.
| |
| − | |}
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| − |
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| − | | align=center width="70" |
| |
| − | <span class="plainlinks">
| |
| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/f/fd/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf]]</span>
| |
| − | <br>
| |
| − | [[Media:Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pdf| Paper]]
| |
| − | | align="center" width="70" |
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| − | <span class="plainlinks">
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| − |
| |
| − | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx]]
| |
| − | </span>
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| − | <br> [http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx Slides]
| |
| − | |}
| |
| − |
| |
| − | {| style="border:2px solid #abd5f5; background:#f1f5fc;"
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| − |
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| − | |
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| − | {|
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| − | |- valign=top
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| − | | width="100" |'''title''':
| |
| − | | width="550"|[[Media:Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf | Reliability Prediction of Electronic Boards by Analyzing Field Return Data]]
| |
| − | |- valign="top"
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| − | | '''authors''':
| |
| − | | Vehbi Comert, Hadi Yadavari, [[Mustafa Altun]], and Ertunc Erturk
| |
| − | |- valign="top"
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| − | | '''presented at''':
| |
| − | | [http://www.esrel2014.org/ European Safety and Reliability Conference (ESREL)], Wroclaw, Poland, 2014.
| |
| − | |}
| |
| − | | align=center width="70" |
| |
| − | <span class="plainlinks">
| |
| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d4/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf]]</span>
| |
| − | <br>
| |
| − | [[Media:Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pdf | Paper]]
| |
| − | | align="center" width="70" |
| |
| − | <span class="plainlinks">
| |
| − |
| |
| − | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx]]
| |
| − | </span>
| |
| − | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides]
| |
| | |} | | |} |
| | | | |
